產(chǎn)品名稱(chēng)：
差分探頭| TDP1000
更新時(shí)間：2025-08-31
產(chǎn)品型號(hào)：TDP1000
產(chǎn)品報(bào)價(jià)：
產(chǎn)品特點(diǎn)：差分探頭| TDP1000 ?Connect Directly to Oscilloscopes with the TekVPI™ Probe Interface?Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information?Remote GPIB/U
TDP1000差分探頭| TDP1000的詳細(xì)資料：
差分探頭| TDP1000
差分探頭| TDP1000
Features & Benefits
Outstanding Electrical Performance
- 1 GHz and 500 MHz Probe Bandwidth
- <1 pF Differential Input Capacitance
- 1 MΩ Differential Input Resistance
- ±42 V （DC + pk AC） Differential Input Voltage
- >18 dB CMRR （at 250 MHz 50X attenuation）
- Selectable Bandwidth-limiting Filters
- DC Reject
Versatile DUT Connectivity
- Small Compact Probe Head for Probing Small Geometry Circuit Elements
- Straight Pin, Square Pin, Solder Down, Variable Pitch Standard Accessories
- Robust Design for Reliability
Easy to Use
- Provides Automatic Units Scaling and Readout on the Oscilloscope Display
- TDP1000, TDP0500
- Connect Directly to Oscilloscopes with the TekVPI™ Probe Interface
- Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information
- Remote GPIB/USB Probe Control through the Oscilloscope
- AutoZero – Zeros Out Output Offset
- P6251
- Connect Directly to the TekProbe™ Interface Oscilloscopes, or to TekConnect® Oscilloscopes using TCA-BNC Adapter
Applications
- High-speed Switch Mode Power Supply Design
- CAN/LIN Bus Design
- High-speed Digital Design
- Digital Design and Characterization
- Manufacturing Engineering Test
- Research and Development
The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today’s Switch Mode Power Supply （SMPS）, CAN/LIN Bus, and high-speed digital system designs.
Specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. The TDP1000, TDP0500, and P6251 High-voltage Differential Probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:
- Outstanding Electrical Performance
- Versatile Device-Under-Test Connectivity
- Ease of Use
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